Bruker's new conductive-doped, diamond-coated probes (Model Number DDESP-V2 and DDESP-FM-V2) provides high performance Scanning Spreading Resistance Microscopy (SSRM), Conductive AFM (C-AFM) and Piezoresponse Force Microscope (PFM) to characterise advanced semiconductor devices, Microelectromechanical Systems (MEMS) and biosensors. These probes provide prolonged tip lifetime in combination with boosted conductivity.
Features:
- High electrical performance due to its consistent tip shape
- Sensitive nanoelectrical measurements with highly conductive coating
- High resolution electrical imaging with sharp conductive tip
- High quality probe manufactured at Bruker AFM probes
Other applications for diamond-coated probes include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterisation applications.