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Bruker Doped Diamond-Coated Electrical Probes

Providing consistent performance and high sensitivity

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Bruker's new conductive-doped, diamond-coated probes (Model Number DDESP-V2 and DDESP-FM-V2) provides high performance Scanning Spreading Resistance Microscopy (SSRM), Conductive AFM (C-AFM) and Piezoresponse Force Microscope (PFM) to characterise advanced semiconductor devices, Microelectromechanical Systems (MEMS) and biosensors. These probes provide prolonged tip lifetime in combination with boosted conductivity.

Features:

  • High electrical performance due to its consistent tip shape
  • Sensitive nanoelectrical measurements with highly conductive coating
  • High resolution electrical imaging with sharp conductive tip
  • High quality probe manufactured at Bruker AFM probes

Other applications for diamond-coated probes include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterisation applications.