Webinar : Shattering EDS Performance Limits with Elite Technologies
With a newly released series of silicon drift detectors (SDD's), EDAX is introducing groundbreaking technology into the world of microanalysis.
These SDD's incorporate several new technology features including a very thin silicon nitride window, full vacuum encapsulation and CUBE technology. They are more sensitive for low energy X-Ray detection and have the fatest electronics throughput in the industry.
These enhancements combine to yield light element analysis of speeds never before obtained. The Octane Elite SDD series sets new benchmarks for performance including the ability to detect All X-ray lines with equal intensity to the higher energy lines.
In this webinar EDAX will review several of the new Octane Elite features and demonstrate their applications and benefits. Combined with the latest in TEAMTM EDS Analysis software these features bring the maximum technology to market.