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New Dimension XR Scanning Probe Microscope

Home News New Dimension XR Scanning Probe Microscope
New Dimension XR Scanning Probe Microscope
05 Dec

New Dimension XR Scanning Probe Microscope

Bruker are please to release the Dimension XR family of scanning probe microscopes (SPM's). These new systems incorporate major AFM innovations, including Bruker's proprietary and exclusive DataCube nanoelectrical modes, AFM-SECM for energy research and the new AFM-nDMA mode, which for the first time correlates polymer nanomechanics to bulk dynamic mechanical analysis (DMA).

For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at Rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1H to 20kHz range for nanoscale measurements of storage modulus, loss modulus, and less tangent that tie directly to bulk DMA.