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July, 2013 

New Generation Stereomicroscopes

Nikon’s new SMZ18 and SMZ25 stereomicroscopes herald a new age in wide field microscopy boasting the world’s largest zoom range of 25:1 (SMZ25).

Images are brighter and sharper at all magnifications thanks to the Nikon Perfect Zoom System and newly designed apochromatically corrected objective lenses. The motorised SMZ25 provides additional convenience with Auto Zoom Link maintaining the field of view when switching between low and high magnification objectives to provide seamless visualisation from wide field to microscopic detail.

The new generation stereomicroscopes can be integrated with a user friendly remote controller or integrated and controlled through the Digital Sight L3 controller. Focus, zoom, objective position, epifluorescence filter cube position and illumination conditions can all be controlled conveniently. Motorisation on the SMZ enables 3D Extended Depth of Focus when controlled with Nikon's proprietary NIS Elements software.

Highly contrasted observation of transparent samples such as plastics and glass is achieved thanks to the Oblique Coherent Contrast illumination system.

Temperature Compensated Probes Enable Continuous Electrical Measurement

Lake Shore cryogenic probe stations offer ideal conditions for probing electrical properties of conducting, semi-conducting and insulating materials at cryogenic to room temperatures.

Lake Shore CVT probes feature flexible mechanics in the probe body enabling the probe to remain engaged on the sample during temperature changes without the need to retract and reland the probe. This provides continuous variable temperature property measurement and greatly reduces variable temperature test times.

With a frequency range of DC-50MHz as standard and to 1GHz with microwave transmission line the ZN50-CVT probes are suitable for a wide range of applications.

All Lake Shore probe stations thermally anchor the probe holder to the sample stage and the probe arm to the radiation shield ensuring minimal heat leakage to the sample upon landing the probe, rapid stabilisation and accurate property measurement.

Orientation Mapping of Thin Films Under Mechanical Strain

The Hysitron in situ TEM and SEM nanoindentation tools provide unprecidented capability for investigating the effects of material strain on the structure of novel materials.

The Hysitron PI-95 TEM PicoIndenter has been used widely for the investigation of nanopilllars, nanowires, nanoparticles. A recently developed force transfer unit, the Push-To-Pull (PTP) device, enables tensile tests to be undertaken with high resolution using the instrument in its compressive mode without the need for special sample and tip geometries or grippers.

A recent application note demonstrates the use of the PI-95 Push-To-Pull devices for determining the orientation gains in thin films at ultrahigh resolution spatially and mechanically.

With capability for indentation, tensile, electrical and heated sample configurations, the Hysitron TEM and SEM PicoIndenters are unlocking the fundamental deformation processes that underpin mechanical behaviour and will drive the next generation of materials.

Image: Microstructural evolution with increasing tensile strain indicates smaller grains (indicated by black arrows) are merging with the large blue grain.

Staff

Dr Paul Wardill
(08) 8150 5279 (0419) 810 220 Email
Jeshua Graham
(08) 8150 5254 (0488) 177 540 Email
Christian Gow
(07) 3345 9556 (0408) 617 243 Email
Andrew Masters
Manager
(0439) 819 095 Email

Coherent Scientific Pty. Ltd., Inc. in South Australia, Established in 1989, ABN 20 008 265 969 

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