main header image
subtle gradient image

January, 2014

ACMM23 / ICONN 2014 - Join us at Booth 83

We would like to invite you along to the Coherent Scientific booth at the ACMM23 / ICONN 2014 conference to be held at the Adelaide Convention Centre from Sunday 2nd to Thursday 6th February.

As a leading distributors for many major international manufacturers, including Bruker, Hysitron, LakeShore and Nikon, come by to learn what is new and exciting in surface metrology, imaging and nanoscale characterisation.

To register for the conference please go here.

SPM Workshop

Interested in Atomic Force Microscopy? Want to learn more about the various AFM imaging modes, instrument operation and calibration, or know how FastScanning AFM or combined RamanAFM can help in your applications? Please join Dr. Christopher Gibson and Ashley Slattery at the Flinders University for this informative two day workshop on Friday 31st January and Saturday 1st February.

Registration is required, click here.

Large Substrate Stylus Profiler Automation and Ease of Use: Dektak XTL Delivers!

Friday 24 January 2014
3am AEDT

Register Online

Quality assurance/quality control (QA/QC) production monitoring in industries such as semiconductor and display panel manufacturing are becoming a more important part of production. This is attributed to the need for smaller, faster and more compact products with increased functionality and capability. This forces manufacturers to produce a more accurate and higher yield in order to meet the demands of their customers and successful ROI.

Bruker recently launched a new stylus profiling system, Dektak XTL, to specifically address these rising demands. Dektak XTL's key applications include metrology of surface roughness, film thickness and etch feature step height dimensions, wafer bow and stress, panel feature dimensions, among others which are keys to enabling wafer and panel production monitoring any time gage capable metrology is required for production.

Attendees in this webcast will learn about the new capabilities DektakXTL has to offer including:
» Intuitive operator interface
» Enhanced GUI for scan and measurement teaching
» Automated pattern recognition for fiducial alignment
» Quick Analyzer functionality
» Enhance automation features for multi-site inspections
» And more...


Christian Gow
Applications Specialist
(07) 3345 9556 (0408) 617 243 Email
Andrew Masters
(0439) 819 095 Email

Coherent Scientific Pty. Ltd., Inc. in South Australia, Established in 1989, ABN 20 008 265 969 

subtle gradient image
bottom footer image