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Bruker Dimension Edge AFM

Bruker Dimension Edge AFM

Bruker Dimension Edge AFM

The best value high-performance AFM

Bruker NanoSurfaces

 

 

The Dimension Edge Atomic Force Microscope (AFM) incorporates Bruker's PeakForce TappingTM technology to provide the highest levels of performance, functionality and accessibility in its class. Based on the Dimension Icon® platform, the Edge system has been designed from top to bottom to deliver low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, all at price points well below expectations for such performance.

ScanAsyst® imaging, integrated visual feedback, and preconfigured settings enable expert-level results simply and consistently, making the most advanced large-sample atomic force microscopy capabilities and techniques available to every facility and user.

Highest Productivity for Any User

  • Proprietary ScanAsyst imaging enables instant expert results
  • High-resolution, 5MP camera and integrated stage control provide fast sample navigation and efficient multi-site measurments
  • Linear workflow and seamless transition from survey to highest resolution delivers accurate results in a short time

Best Value Closed-Loop Dimension AFM

  • Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels
  • Significantly reduced noise and drift values bring small-sample imaging performance to a large-sample AFM
  • Modular microscope and electronics design enable high image fidelity at moderate cost

Solutions for All Applications on Any Sample

  • Open stage access accommodates wide variety of experiments and samples
  • New instrument design and software take full advantage of Bruker's full suite of AFM modes, including advanced electrical and electrochemical applications
  • Built-in access to signal routing enables custom measurements to take research in new directions

For further information please contact us or download the datasheet.

 

                                             

Dimension Edge brochure                                    Read more on Bruker's website