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Bruker Dimension FastScan AFM

Bruker Dimension FastScan AFM

Bruker Dimension FastScan AFM

Flagship AFM for Nanoscale Research

Bruker NanoSurfaces

 

 

  • Achieve the Highest Resolution - Any Time, Every Time
  • Unleash Bandwidth to go Fast and Explore Real-Time Changes
  • Unlimited Potential - Fully Flexible and Open Architecture
  • Capture the Most Complete Quantitative Nanoscale Property Data
  • Surprisingly Simple

High Productivity

  • Work hundreds of times faster with fast scanning rates up to frames per second, automated laser and detector alignment, comprehensive work flow and smart engaging
  • Built-in measurement automation software in conjunction with higher speed ScanAsyst® provide exceptional measurement confidence and repeatability

High Resolution

  • Precise force control at the tip renders high resolution and long tip-life
  • High quality TappingModeTM images can be achieved at 20Hz and superb-quality ScanAsyst images at 6Hz
  • Low-noise, temperature-compensated sensors in the scanners maintain sub-nanometer noise levels

High Performance on Any AFM Sample

  • Closed-loop Icon and FastScan scanners keep vertical noise below 30pm and 40pm, respectively, as well as high accuracy with ultra-low drift
  • Sample from subnanometer to hundreds of nanometers in height without loss of resolution

Whether using the Icon scanner with ultra-low noise and high accuracy, or employing the FastScan scanner for high scan rates, the Dimension FastScan system will expand your laboratory's capabilities beyond that of any other single instrument you can purchase.

Image Right: Dimension FastScan System Configuration: (1) Acoustic and Vibration Isolation Enclosure; (2) Scanners; (3) Ultra-Stable High-Resonance Microscope Base; (4) 30" Monitor and FastScan NanoScope Software; (5) Computer; (6) NanoScope V, Stage Controller and HV Amplifiers

For further information please contact us or download the datasheet.

 

 

                                                  

Dimension FastScan brochure                                     Read more on Bruker website