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Bruker Multimode 8 Highest Resolution AFM

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Bruker Multimode 8 Highest Resolution AFM

Bruker Multimode 8 Highest Resolution AFM

The benchmark for high-performance Atomic Force Microscopy

Bruker NanoSurfaces

The MultiMode platform's success is based on its combination of superior resolution, performance, and unparalleled versatility and productivity. The new MultiMode 8-HRTM AFM takes full advantage of these developments to provide significant improvements in imaging speed, resolution, and nanomechanical performance with higher speed PeakForce Tapping®, enhanced PeakForce QNM®, new FastForce VolumeTM and exclusive Bruker probes technology.

The MultiMode8-HR provides:

  • The highest resolution imaging - any time, every time, every mode
  • Image like an expert with ScanAsyst real-time image optimisation
  • Improved PeakForce Tapping control offering better imaging performance with unique and direct tip/sample imaging force control
  • Get results faster with improved high speed AFM imaging and newly developed piezoscanners
  • Highest resolution nanomechanical imaging capability of directly measured surface properties such as modulus, adhesion and deformation
  • The widest nanomechanical measurement capability range from 1kPa to >100GPa and viscoelastic property measurement from 0.1Hz to 4kHz
  • Advanced nanoElectrical capabilities with PeakForce-Tunnelling Conductive AFM, and PeakForce-Kelvin Probe Force Microscopy simultaneous with Nanomechanical measurement and morphology for better correlation of material properties
  • Flexible architecture - design and develop your own experimental techniques

For further information please contact us or download the datasheet.

 

                                              

MultiMode 8 brochure                                           Read more on Bruker's website