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Bruker RTESP/A Silicon AFM Probes

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Bruker RTESP/A Silicon AFM Probes

Industry standard for TappingMode and non-contact imaging modes

Bruker NanoSurfaces

Bruker AFM Probes has introduced an improved version of its popular MPP line of AFM probes. Bruker's new RTESP/A high quality, premium etched silicon probes with rotated tips complement the TESP-V2 range of probes and sets the industry standard for imaging in TappingModeTM , non-contact mode in air, force modulation measurements, and contact mode imaging.

The new RTESP/A design provides :

  • A rotated probe tip for a more symmetrical representation of sample fatuers
  • Tighter dimensional specifications for improved probe-to-probe consistency
  • Tighter alignment of the tip apex at the cantilever resulting in easier laser positioning over the tip
  • Improved probe quality and aesthetics

New and legacy model numbers for the kep product lines are provided below :

MPP-111 product range is replaced by RTESP/A-300
MPP-121 product range is replaced by RTESP/A-150
MPP-131 product range is replaced by RTESP/A-525

For further information please contact us or read more on Bruker's website.