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Lake Shore 8425 DC Hall System with Cryogenic Probe Station

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Lake Shore 8425 DC Hall System with Cryogenic Probe Station

Non-destructive Hall measurement of wafer-scale materials in a tightly controller cryogenic environment

LakeShore

Featuring the latest in Lake Shore Hall measurement capabilities, the Model 8425 is ideal for a number of applied physics, electrical engineering, materials research, and product R&D applications. Measure electronic and magneto-transport properties of novel materials, including:

III-V semiconductors—InP, InSb, InAs, GaN, GaP, GaSb, AIN-based devices, high-electron mobility transistors (HEMTs), heterojunction bipolar transistors
II-VI semiconductors—CdS, CdSe, ZnS, ZnSe, ZnTe, HgCdTe
Elemental semiconductors—Ge, Si on insulator devices (SOI), SiC, doped diamond SiGe-based devices (HBTs and FETs)
High-temperature superconductors

Features:

  • A complete Hall effect measurement system using device probing under vacuum in a probe station
  • Supports a range of DC field Hall measurements—measure mobility on wafer-scale materials and structures as a function of temperature and field
  • DC fields to 2T and resistances from 0.5mΩ to 100GΩ
  • Vary temperatures from 10K to 400K using closed-cycle refrigerator—no cryogen required
  • Includes intuitive 8400 Series software for easy system operation, data acquisition, and analysis
  • Supports exporting of data for multi-carrier analysis
  • 3-year standard warranty

For further information please contact us or download the datasheet.

                                          

8423 brochure                                                             8400 brochure

Read more on Lake Shore's website