site site site my site my site my site
+61 8 8150 5200

Australia • New Zealand

Lake Shore 8425 DC Hall System with Cryogenic Probe Station

Home Products Instrumentation Hall Measurement Systems Lake Shore 8425 DC Hall System with Cryogenic Probe Station

Lake Shore 8425 DC Hall System with Cryogenic Probe Station

Non-destructive Hall measurement of wafer-scale materials in a tightly controller cryogenic environment


Featuring the latest in Lake Shore Hall measurement capabilities, the Model 8425 is ideal for a number of applied physics, electrical engineering, materials research, and product R&D applications. Measure electronic and magneto-transport properties of novel materials, including:

III-V semiconductors—InP, InSb, InAs, GaN, GaP, GaSb, AIN-based devices, high-electron mobility transistors (HEMTs), heterojunction bipolar transistors
II-VI semiconductors—CdS, CdSe, ZnS, ZnSe, ZnTe, HgCdTe
Elemental semiconductors—Ge, Si on insulator devices (SOI), SiC, doped diamond SiGe-based devices (HBTs and FETs)
High-temperature superconductors


  • A complete Hall effect measurement system using device probing under vacuum in a probe station
  • Supports a range of DC field Hall measurements—measure mobility on wafer-scale materials and structures as a function of temperature and field
  • DC fields to 2T and resistances from 0.5mΩ to 100GΩ
  • Vary temperatures from 10K to 400K using closed-cycle refrigerator—no cryogen required
  • Includes intuitive 8400 Series software for easy system operation, data acquisition, and analysis
  • Supports exporting of data for multi-carrier analysis
  • 3-year standard warranty

For further information please contact us or download the datasheet.


8423 brochure                                                             8400 brochure

Read more on Lake Shore's website