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Understanding Kelvin Probe Force Microscopy (KPFM)

Home News Understanding Kelvin Probe Force Microscopy (KPFM)
Understanding Kelvin Probe Force Microscopy (KPFM)
08 Dec

Understanding Kelvin Probe Force Microscopy (KPFM)

Designed for AFM Users to Support your Research Needs


Thursday 16 December, 2pm AEDT


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The combination of Atomic Force Microscope (AFM) of Kelvin Probe technique brings a powerful tool to map Contact Potential Difference (CPD) on conducting and semi-conducting samples. The basic idea of KPFM is the same - An AC voltage with certain frequency as applied between AFM tip and sample; and the resulting electrostatic force is detected by a lock-in amplifier.

 

Join this webinar to learn what signals are acquired from the lock-in amplifier and how they are used as feedback to measure the CPD. Common questions would also be answered including :

  • Which channel should be monitored during KPFM measurement?
  • Can HOPG be used as a standard sample for KPFM?
  • Any parameters other than lift height and AC voltage, can be adjusted to improve the measurement?