Webinar : Getting the Most out of your Data OIM Analysis 9

Webinar : Getting the Most out of your Data OIM Analysis 9

Date: Thursday 27 February 2025
Time: 4am NZDT  |   2am AEDT  |   11pm AEST (26 Feb)
 

If you are not a night owl, resiter your interest and the recording will be sent to you after the event.

For electron backscatter diffraction (EBSD) users, typical measurement results consist of maps and charts displaying the microstructure of the sample. In many cases, these may simply be generic maps like inverse pole figure (IPF) and image quality (IQ) maps, which can easily be generated with a single mouse click. In addition to these basic analysis options, the EDAX OIM Analysis™ software offers an extensive range of analytical tools to quantify many of your materials’ microstructure components. Customisation of your analyses allows targeted and highly detailed analysis of specific features of the microstructure.
 

To better lead users through all the capabilities, OIM Analysis 9.1 introduces a new ribbon bar layout that combines easy access to the basic analysis tools with powerful customisation capabilities using templates. This webinar will guide you through the workflow and capabilities of OIM Analysis 9.1 from basic data analysis to automatic reporting.