BioAFM Update Webinar : Improved Spatial and Temporal Resolution
Wednesday 1 December 2021, 2pm AEDT
As the value of Atomic Force Microscopy (AFM) in life science has been increasingly recognised, its applications have been expanded well beyond the basic topography and nanomechanical characterisation. Efforts have been devoted to improving the performance of AFM and innovating new functionalities. For example, the limits of spatiotemporal resolution have been abidingly pushed to resolve detailed features or dynamic events at bio samples; sophisticated models and specialised hardware have been introduced to not only improve the accuracy of nanomechanical measurements, but also make dynamic mechanical analysis at nanoscale possible; seamless integration to other optical technologies makes AFM no longer a standalone tool but a multi-functional analysis platform.
In this webinar, we are going to share the recent developments on BioAFM, and more importantly, to showcase how these improvements and innovations have helped solve practical questions researchers have been keen to answer.
Dr. Yun Chen works as Application Scientist at Bruker Nano Surfaces, focusing on exploring application and providing technical support of surface metrology and tribology instruments. He was academically trained in biomedical engineering, biotechnology, and physical chemistry. His PhD work in University of Groningen, Netherlands focused on investigating bacterial behaviors on various biomaterial surfaces. Before joining Bruker, Yun pursued his academic career in Leeds University, UK, working on resolving molecular interactions and kinetics involved in the initial stage of amyloid formation.
Nanomechanical Testing and Property Correlation Webinar Series
Depth Sensing Nanoindentation is a simple yet powerful technique to study the mechanical properties of material at nano to microscale scale. Nanoindentation is not just a metallurgist tool. It is widely accepted in the field of bioscience, tissue engineering, development of biomedical devices and sensors; and is applicable in industries ranging from pharmaceuticals (crystal engineering), aerospace (thermal barrier coating), to automobile (protective coatings, high strength steel) and Abrasives.
Bruker and Industron are pleased to present a series of webinars where we will share from the basics of Nanomechanical Testing to the latest advancements. Join us in this 4 parts webinar series to learn more.
Webinar 1 | Wednesday 17 November 3:30pm AEDT
Introduction to Depth-Sensing Nanoindentation and Nano-Tribological Testing and Applications
Webinar 2 | Friday 26 November 3:30pm AEDT
Advanced Dynamic Nanomechanical Testing and High Temperature Application
Webinar 3 | Wednesday 8 December 3:30pm AEDT
Introduction to In-Situ Nanoindentation Testing and Property Mapping
Webinar 4 | Friday 17 December 3:30pm AEDT
Tensile and High Temperature Nanoindentation inside Scanning Electron Microscope (SEM)
Introducing the New Dimension IconIR
Wednesday 10 November 2021, 12 Midnight AEDT
(If you are not a night owl, please register via the link below to have a copy of the webinar sent to you after the event)
Introducing the NEW Dimension IconIR, a system that combines Bruker’s industry-leading Dimension Icon® AFM and nanoIR™ photothermal IR nanospectroscopy to establish new standards in nanoscale property mapping. The IconIR delivers a comprehensive correlative spectroscopy and microscopy solution for quantitative nanochemical, nanomechanical and nanoelectrical characterisation on a single platform.
Please join us and our special guest Prof. Alex Dazzi, University Paris-Saclay, France, for this 2-hour virtual workshop where we will introduce the IconIR, and demonstrate exciting new features and state-of-the-art capabilities.
Featuring sub-10nm chemical imaging resolution with monolayer sensitivity, the system’s large-sample architecture significantly extends the capacities of the Dimension Icon, the world’s most used large-sample AFM platform, to provide ultimate sample flexibility and renowned performance.
The standard system supports samples of up to 150mm, with options for larger samples also available. Bruker’s patented suite of photothermal-based AFM-IR spectroscopy modes is the most comprehensive available, with hundreds of publications demonstrating its success as the world’s leading nanoIR technology.
The IconIR is expected to enable groundbreaking research across a broad range of polymer, geoscience, semiconductor, and life science applications.Read More
AFM Probe Selection Webinar
Join us for a free virtual workshop on AFM probe selection on Wednesday 27 October 2021. During this workshop Mickael Febvre and Alexander Dulebo will explain the fundamentals of AFM probe design, provide an overview of the probes available and their properties, and outline how to select the right probe for the right application. There will also be a short presentation on the latest innovations in probe development for biological and materials sciences applications.
Meet the Bruker Team
Dr Mickael Febvre, Application Manager
Dr Alexander Dulebo, Application Scientist
Thin Film Measurement Webinar Series
As thin film technology advances, there is ever increasing demand in decreasing the film thicknesses of products for modern industries, especially in the semiconductor, hard coating and display industries. This evolution poses different challenges in manufacturing technology; including understanding the intrinsic film mechanical properties and evaluating the relationship between thin film mechanical properties and product quality. Nanoindentation and Scratch testing have thus become the most widely used techniques to meet these challenges.
Bruker understands your needs and challenges in Thin Film and ultra-thin film measurements. We are pleased to present this 4-part webinar series, where we will share about the nanomechanical technology relevant in thin films for research and industrial applications along with case studies.
Webinar 1: 1pm Thursday 12 August AEST Register
Challenges in Thin Film Hardness, Modulus Measurement Solutions
Webinar 2: 1pm Thursday 26 August AEST Register
Thin Film Interface Adhesion Characterisation for Industrial Applications
Webinar 3: 1pm Thursday 9 September AEST Register
Industrial Solutions of Measuring Thin Film Fracture Toughness
Webinar 4: 1pm Thursday 23 September AEST Register
Importance of Thin Film Mechancial Properties under Environmental Controls
If you have any questions at all, please contact us. We hope to see you at the webinar !Read More