News

Date: Friday 19 April 2024
Time: 5am NZST, 3am AEST, 1am AWST

If you are not a night owl register for the webinar and you will receive a copy after the event :)

Are you looking to dive deeper into the capabilities of your BioAFM? Do you want to learn about the latest advancements in the field? Are you ready to enhance your experimental skills with practical tips and advanced techniques? Then this is the place for you! Whether you’re a seasoned user or new to the field, this is the perfect opportunity to get YOUR questions answered. Join us on April 18, 2024 to engage directly with Bruker’s specialists in a live, user-driven Q&A session and case-based discussion.

Webinar Speakers
Yi Wei, Ph.D. Applications Scientist, Bruker
Ming Ye, Ph.D. Applications Scientist, Bruker

Date : Wednesday 10 April 2024
Time : 3am NZST, 1am PDT AEST, 11pm AWST (Tues 9th)

If you are not a night owl register for the webinar and you will receive a copy after the event :)

Join Bruker for a short, candid webinar, where various Bruker application engineers worldwide are interviewed on what their favorite, go-to probe is and why. They will also virtually visit various demonstration labs to get tips and tricks from dedicated BioAFM, nanoIR, and automated AFM application engineers. You'll definitely discover some new probe types and maybe new ways to use legacy types!

Webinar Speakers : Ian Armstrong, Ph.D., Bruker

Date: Friday 22 March 2024
Time: 5am NZDT, 3am AEST, 12am Midnight AWST
 

Join us and our special guest speaker Dr. George Heath, University of Leeds, UK, for this virtual workshop on high-speed atomic force microscopy (AFM). The webinar will focus on the fundamental principles of the technique, relevant applications, and its integration with advanced optical microscopy.
 

Dr. Heath will speak about his work using the NanoRacer high-speed atomic force microscope to study protein dynamics and will present methods that can increase the temporal and spatial resolution of AFM to the 10 microsecond and sub-nm level. The webinar will provide an overview of the latest developments in high-speed AFM and will include a demonstration on the NanoWizard ULTRA Speed 3 BioAFM, live from our laboratories in Berlin, Germany.

Date: Friday 1 March 2024
Time: 5:00am NZDT, 3:00am AEDT, Midnight AWST
 

Electron multiplying CCD (EMCCD) and intensified CCD / sCMOS (iCCD / isCMOS) cameras are capable of high temporal resolution optical measurements with single-photon sensitivity. They are tremendously useful for studying combustion, plasma evolution and quantum optics among other applications. Getting the most from these cameras requires a detailed understanding how they work.

Join us for a 4-part tutorial on time-resolved detector technologies, comparing the capabilities of different sensor and camera technologies, and a step-by-step tour through how they make measurements, their strengths and limitations. We will break down some example applications, and provide a venue for discussion of experimental challenges with our applications staff. Focus will be on the Andor iXon and iStar cameras, but the concepts will be generally applicable.

Learn about nanoindentation-based methods to improve thermomechanical design of integrated structures
 

Date: Thursday 7 March 2024
Time: 6:00am NZDT, 4:00am AEDT, 1:00am AWST
 

If you are not a night owl, register, and you will receive a recording after the event :)

An increasing number of material classes and complex geometries are found in integrated structures for semiconductor devices, elevating the importance of considering thermomechanical integrity to ensure optimal performance, reliability, and yield. Using nanoindentation-based characterisation methods is a valuable way to understand thermomechanical integrity.

During this free webinar, our guest speaker, Dr. Kris Vanstreels from imec, will discuss several nanoindentation based approaches will be demonstrated that can be used to study the thermomechanical integrity of thin films and nano-interconnects for semiconductor applications.

Webinar Presenter:
Dr. Kris Vanstreelse, Researcher, Reliability and Modeling Group, imec

Nanomechanical Test Systems	Nanomechanical Instruments for SEM/TEM	Nanomechanical Metrology Tools