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Bruker Dimension Icon Raman AFM

Bruker Dimension Icon Raman AFM

Bruker Dimension Icon Raman AFM

Highest performance AFM with integrated Raman spectroscopy

Bruker NanoSurfaces

The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample.

When these techniques are further enhanced with advanced AFM modes, such as Bruker exclusive PeakForce TUNA electrical characterisation and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties.


  • Fully integrated system delivers convenient correlation of advanced AFM data with information on chemical composition or crystallographic structure
  • High-resolution X-Y stage permits fast and accurate positioning between the AFM and Raman microscope
  • Full range of AFM capabilities provides more features than any other system
  • PeakForce QNM® enables quantitative nanoscale mechanical property mapping
  • Wide-open access to tip and sample accommodates a large variety of standard and customised experiments
  • ScanAsyst® enables dramatically more productive imaging with fully automatic parameter optimisation, guaranteeing best results on the most delicate samples

For further information please contact us or download the datasheet.

Dimension Icon Raman brochure Read more on Bruker's website