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Bruker Dimension XR SPM

Bruker Dimension XR SPM

Bruker Dimension XR SPM

Extreme research systems for nanomechanics, nanoelectrical and nanoelectrochemistry

Bruker NanoSurfaces

Bruker's Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation. With routine atomic defect resolution, and a host of unique technologies including PeakForce Tapping, Data Cube modes, SECM and nanoDMA, they deliver the utmost performance and capability. The Dimension XR family of SPMs package these technologies into turnkey solutions to address nanomechanical, nanoelectrical, and electrochemical applications. Quantification of materials and active nanoscale systems in air, fluid, electrical, or chemically reactive environments has never been easier.

The XR Nanomechanics bundled solution encompasses the full evolution of nanoscale AFM nanomechanical measurement techniques, including Bruker's new, revolutionary AFM nano-dynamic measurement analysis. This is the first and only AFM solution that ties to bulk DMA.

Revolutionary AFM-nDMA

For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1 Hz to 20 kHz range for nanoscale measurements of storage modulus, loss modulus, and loss tangent that tie directly to bulk DMA.

Proprietary DataCube Modes

These modes utilise FASTForce Volume to perform a force-distance spectrum in every pixel, with a user-defined dwell time. Using high data capture rates, a multitude of electrical measurements are performed during the dwell time, resulting in electrical and mechanical spectra at every pixel. DataCube modes provide full characterisation in a single experiment, which is unheard of in a commercial AFM.

Highest Resolution Scanning Electrochemical Imaging

The Dimension XR NanoEC configuration for Icon and FastScan AFM systems provides a turnkey solution for real-time quantitative analysis of electrochemical reactions. These systems utilise EC-AFM and PeakForce SECM™ modes to perform in-situ topography scans in the electrochemical cell, and are specifically designed for long-term in situ electrode studies under electrochemical control and in volatile solvents.

Exclusive PeakForce SECM

With a spatial resolution less than 100 nanometres, this mode redefines what is possible in the nanoscale visualisation of electrical and chemical processes in liquid. PeakForce SECM dramatically improves, by orders of magnitude, the resolving power over traditional approaches. This enables entirely new research into energy storage systems, corrosion science and biosensors, opening the door to novel measurements on individual nanoparticles, nanophases, and nanopores. Only, PeakForce SECM provides simultaneous capture of topographic, electrochemical, electrical, and mechanical maps with nanometre-scale lateral resolution.

For further information please contact us or download the datasheet.

Dimension XR brochure Read more on Bruker's website