Bruker/JPK NanoWizard 4 XP Nanoscience AFM

The NanoWizard 4XP NanoScience atomic force microscope delivers atomic resolution performance and a large scan range of 100μm in one system. It enables fast scanning with rates of up to 150 lines/sec and seamless integration with advanced optical techniques. With a wide range of modes and accessories for environmental control, mapping of nanomechanical, electrical, magnetic or thermal properties, makes it the most flexible system available on the market today.

Features:

• PeakForce Tapping® for easy imaging
• Fast Scanning option with up to 150 lines/sec
• NestedScanner Technology for high-speed imaging of surface structures up to 16.5μm with outstanding resolution and stability
• New tiling functionality for automated analysis of large sample areas
• V7 Software with revolutionary new workflow-based user interface
• DirectOverlay^TM 2 software for perfect integration and data correlation with advanced fluorescence microscopy platforms
• Vortis^TM 2 controller for highs-peed signal processing and lowest noise levels

Image right: Phase images showing dynamic growth front of a poly-hydroxybutyrate-co-valerate (PHB/V) spherulite crystallisation. Line rate : 150line.sec.

PeakForce Tapping

PeakForce Tapping provides superior force control and an uncomplicated setup, no matter what the sample or enviroment. No expert knowledge or cantilever tuning is necesary. It enables precise control of probe-to-sample interactions and minimises imaging forces, thereby protecting your tip and ensuring consistent, long-term, high-resolution imaging.

Image right: PeakForce Tapping images of Isotactic Polypropylene (IPP) dropcast as a thin film. (1) Topography overview image with inset region marked. Height range: 50nm (2) Topography zoom into marked region. Height range:25nm

For further information please contact us or download the datasheet.