Gatan Multiple Specimen Holders

Accommodate multiple specimens for increased productivity

Details
Literature

Transmission electron microscope (TEM) multiple specimen holders provide increased productivity for applications that require comparable screening of multiple specimens.

Operates at ambient temperature or cryo-temperature, depending on holder model
Interchangeable cartridge design facilitates handling and storage of fragile specimens
Opening on one side of FIBBEM™ cartridges allows access of the ion beam and reactive gasses to interact with the samples; cartridge can then be attached to the holder for viewing in the TEM

Model Number	Specimen Positioning	Specimen Securing	Interchangeable Cartridge	Operating Temperature
677	α Tilt	Hexring mechanism	Yes^1,2	Ambient
677FIB	α Tilt	FIBBEM catridge	Yes¹	Ambient
910	α Tilt	Splitring mechanism	Yes³	< -170°C

1.Two specimen positions are available in holders for the Hitachi and Zeiss TEMs. Three specimen positions are available in holders for FEI and Topcon TEMs. Five specimen positions are available in holders for the JEOL TEMs.
2 Small pole piece gap configuration does not have a removable cartridge.
3 Two specimen positions are available in holders for the Hitachi and Zeiss TEMs. Three specimen positions are available in holders for FEI, JEOL and Topcon TEMs.

For further information please contact us or download the datasheets.