News

Day : Friday 10 May 2024
Time : 3am NZST, 1am AEST, 11pm AWST (Thurs 9th)
 

If you are not a night owl register for the webinar and you will receive a copy after the event :)

Learn about Bruker’s latest and most advanced nanomechanical and nanotribological test system, the Hysitron TI 990 TriboIndenter. Building upon a 25-year TriboIndenter legacy, the TI 990 has been completely redesigned from the ground up to deliver new levels of sample throughput, measurement control, testing flexibility, measurement reliability and performance, and ease-of-use. With an all-new system architecture and advanced testing modes, the TI 990 is set to redefine the landscape of nanomechanical and nanotribological testing.
 

Join us to find out:

• What is new about the TI 990 system architecture?
• What advancements are integrated into the new nanoDMA IV and XPM II?
• How is the new Performech III controller different?
• What does the redesigned TriboScan 12 software look like?

The webinar will also include a demonstration of the Hysitron TI 990 TriboIndenter.

Webinar Speakers:
David Wodnick, Bruker Nanosurfaces and Metrology
Radhika Lazminarayana, Bruker Nanosurfaces and Metrology

Date : Wednesday 10 April 2024
Time : 3am NZST, 1am PDT AEST, 11pm AWST (Tues 9th)

If you are not a night owl register for the webinar and you will receive a copy after the event :)

Join Bruker for a short, candid webinar, where various Bruker application engineers worldwide are interviewed on what their favorite, go-to probe is and why. They will also virtually visit various demonstration labs to get tips and tricks from dedicated BioAFM, nanoIR, and automated AFM application engineers. You'll definitely discover some new probe types and maybe new ways to use legacy types!

Webinar Speakers : Ian Armstrong, Ph.D., Bruker

Learn about nanoindentation-based methods to improve thermomechanical design of integrated structures
 

Date: Thursday 7 March 2024
Time: 6:00am NZDT, 4:00am AEDT, 1:00am AWST
 

If you are not a night owl, register, and you will receive a recording after the event :)

An increasing number of material classes and complex geometries are found in integrated structures for semiconductor devices, elevating the importance of considering thermomechanical integrity to ensure optimal performance, reliability, and yield. Using nanoindentation-based characterisation methods is a valuable way to understand thermomechanical integrity.

During this free webinar, our guest speaker, Dr. Kris Vanstreels from imec, will discuss several nanoindentation based approaches will be demonstrated that can be used to study the thermomechanical integrity of thin films and nano-interconnects for semiconductor applications.

Webinar Presenter:
Dr. Kris Vanstreelse, Researcher, Reliability and Modeling Group, imec

Nanomechanical Test Systems	Nanomechanical Instruments for SEM/TEM	Nanomechanical Metrology Tools

Date: Thursday 7 March 2024
Time: 3:30AM ACDT
 

If you are not a night owl, register, and you will receive copy of the recorded webinar after the event :)

An increasing number of material classes and complex geometries are found in integrated structures for semiconductor devices, elevating the importance of considering thermomechanical integrity to ensure optimal performance, reliability, and yield. Using nanoindentation-based characterisation methods is a valuable way to understand thermomechanical integrity.
 

During this free webinar, our guest speaker, Dr. Kris Vanstreels from imec, will discuss several nanoindentation based approaches will be demonstrated that can be used to study the thermomechanical integrity of thin films and nano-interconnects for semiconductor applications.
 

Webinar Presenter
Dr. Kris Vanstreelse
Researcher
Reliability and Modeling Group, imec

Featured Technologies:
Nanomechanical Test Systems
Nanomechanical Instruments for SEM/TEM
Nanomechanical Metrology Tools

Fast automated imaging and seamless integration with advanced optics

Introducing the new NanoWizard® ULTRA Speed 3 AFM, a powerful addition to the Bruker BioAFM product family. It marks a milestone in speed, automation, and performance.

Advanced automation features and an unprecedented scanning speed of 1,400 lines per second have been combined in one instrument, that can be seamlessly integrated into advanced optical microscopy and super-resolution techniques.

Discover best-in-class automation capabilities:

• Fully automated set-up, alignment, and re-adjustment of system parameters
• Single-click, automated cantilever and optical image calibration
• Automated, high pixel density mapping and imaging
• New DynAsyst feature for automated scan parameter adjustment
• Fast, automated scanning of challenging, highly corrugated samples

For further infromation please contact us or read more.