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Bruker Hysitron PI95 TEM PicoIndenter

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Bruker Hysitron PI95 TEM PicoIndenter

Bruker Hysitron PI95 TEM PicoIndenter

Quantitative, direct observation, nanomechanical testing inside your TEM

Bruker NanoSurfaces

The PI 95 TEM PicoIndenter instrument from Bruker is the first full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing inside a transmission electron microscope (TEM). The PI 95 is also highly customisable and upgradable with available heating, electrical, or tribological (scratch) upgrade options to accommodate an expansive range of current and future materials research.

Customised Solution for your TEM

The PI95 has been carefully designed for compatibility with JEOL, FEI, Hitachi, and Zeiss microscopes. With this instrument it is not only possible to image the mechanical response of nanoscale materials, but also acquire quantitative mechanical data simultaneously. The integrated video interface allows for synchronisation between the load-displacement curve and the corresponding TEM video.

Nanoscale Investigation

The PI95 TEM PicoIndenter is uniquely suited for the investigation of nanoscale phenomena. Performing these types of studies in the TEM can provide unambiguous differentiation between the many possible causes of force or displacement transients which may include dislocation bursts, phase transformations, spalling, shear banding or fracture onset.

Uparalleled Performance

The PI95 utilises three levels of control for tip positioning and mechanical testing. In addition to a three-axis coarse positioner and a 3D piezoelectric actuator for fine positioning, the instrument is equipped with a transducer for electrostatic actuation and capacitive displacement sensing for acquiring quantitative nanoscale mechanical data.

For further information please contact us or download the datasheet.

                                 

          PI95 datasheet                                             Read more on Bruker's website