Bruker Dimension 2D Atomic Force Microscopes

Dimension 2D systems combine Bruker’s proven, industry-leading AFM platforms with a curated suite of highest-priority modes and capabilities to meet the critical requirements of modern 2D materials research.

These turnkey systems maintain ultimate stability for up to atomic defect resolution. Motorised staging streamlines flake-finding, stitched optical overviews, automated imaging routines, and large-area surface cleaning or smoothing. An open-access, large-sample, tip-scanning instrument design enables cutting-edge experiments from in-situ device testing to quantum twisting microscope (QTM) integration.

• Characterise diverse 2D material systems, including graphene, TMD's, hBN, MXenes, and VDw heterostructures

• Interrogate layers, defects, interfaces and moiré-scale structure across fragile exfoliated flakes, CVD films, and device-relevant samples

• Correlate structure with local functional response, such as electrical or nanomechanical behaviour, through repeatable, site-targeted measurements

• Navigate large sample areas with ease for flake-finding, optical overview imaging, automated imaging routines, and sample cleaning or smoothing

• Tailor system setups to accommodate non-standard requirements, including quantum twisting microscope (QTM) integration, twistronics studies, and studies under environmentally controlled or custom conditions