Bruker Doped Diamond-Coated Electrical Probes

Bruker's new conductive-doped, diamond-coated probes (Model Number DDESP-V2 and DDESP-FM-V2) provides high performance Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscope (PFM) to characterise advanced semiconductor devices, Microelectromechanical Systems (MEMS) and biosensors provide prolonged tip lifetime in combination with boosted conductivity.

Features:

• High electrical performance due to its consistent tip shape

• Sensitive nanoelectrical measurements with highly conductive coating

• High resolution electrical imaging with sharp conductive tip

• High quality probe manufactured at Bruker AFM probes

Other applications for diamond-coated probes include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterisation applications.