The game-changing advancements in the EDAX Octane Elite energy dispersive x-ray spectroscopy (EDS/EDX) system with Octane Elite silicon drift detectors (SDDs) take EDS analysis to the next level. This system includes detectors with a silicon nitride (Si3N4) window, offering remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite detectors also use high-speed x-ray data processing technology within a smaller and fully vacuum-encapsulated detector device.
The Octane Elite SDDs are available in two models:
EDAX Octane Elite Plus - 30 mm2 chip
EDAX Octane Elite Super - 70 mm2 chip
Features:
Best light element performance : The silicon nitride window offers significant improvements compared to a polymer window, improving light element performance and significantly more critical data for the analyst.
Si3N4 window : The silicon nitride window offers superior low-energy transmission compared to a polymer window.
Low kV performance : The mechanical properties of Si3N4 allow the use of thinly fabricated windows, offering a great benefit in terms of sensitivity and optimal low-voltage analysis.
Throughput : EDAX EDS systems with advanced detection electronics offer the highest throughput count rates on the market for the best possible analysis and increased productivity.
Reliability : The material properties and durability of Si3N4 ensure the most robust and reliable detectors available for all EDS applications.
Motorised slide : The motorised slide offers complete control of the detector via the software and is optimal for analytical flexibility. It is ideal for all focused ion beam (FIB) systems.
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Sales and Applications EM
Sydney • New South Wales