Gatan Analytical Holders

TEM analytical holders are designed for basic imaging and analytical applications, such as electron diffraction and energy dispersive x-ray spectroscopy (EDS) analysis of crystalline TEM specimens.

Features:

A beryllium specimen cradle minimizes unwanted x-ray signals
Cut-outs in the specimen tip are matched to the TEM configuration and provide a clear path between the sample and detector to reduce shadowing for EDS analysis
To facilitate quantitative x-ray analysis, non-rotating holder versions are equipped with a small Faraday cup located near the specimen cradle at the tip of the holder
Electrical connections are available for the non-rotating versions of the holder

Model Number	Beryllium Cradle	Specimen Positioning	Specimen Securing	Motorised Control	Faraday Cup	Max. electrical feed-throughs (optional)
643	Standard	α Tilt	Hexring mechanism		Standard	6
646	Standard	α, ß Tilt	Hexring	ß Tilt	Standard	4-6 *
650	Standard	α Tilt and rotation	Hexring	Rotation	No	0
925	Standard	α, ß Tilt and rotation	Hexring		No	0

* 2-6 for JEOL UHR, 2-4 for all other EMMs

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