TEM analytical holders are designed for basic imaging and analytical applications, such as electron diffraction and energy dispersive x-ray spectroscopy (EDS) analysis of crystalline TEM specimens.
Features:
A beryllium specimen cradle minimizes unwanted x-ray signals
Cut-outs in the specimen tip are matched to the TEM configuration and provide a clear path between the sample and detector to reduce shadowing for EDS analysis
To facilitate quantitative x-ray analysis, non-rotating holder versions are equipped with a small Faraday cup located near the specimen cradle at the tip of the holder
Electrical connections are available for the non-rotating versions of the holder
| Model Number | Beryllium Cradle | Specimen Positioning | Specimen Securing | Motorised Control | Faraday Cup | Max. electrical feed-throughs (optional) |
| 643 | Standard | α Tilt | Hexring mechanism | Standard | 6 | |
| 646 | Standard | α, ß Tilt | Hexring | ß Tilt | Standard | 4-6 * |
| 650 | Standard | α Tilt and rotation | Hexring | Rotation | No | 0 |
| 925 | Standard | α, ß Tilt and rotation | Hexring | No | 0 |
2-6 for JEOL UHR, 2-4 for all other EMMs
Send us a message and our team will get back to you.
Sales and Applications EM
Sydney • New South Wales
Field Service
Sydney • New South Wales