TEM analytical holders are designed for basic imaging and analytical applications, such as electron diffraction and energy dispersive x-ray spectroscopy (EDS) analysis of crystalline TEM specimens.
Features:
A beryllium specimen cradle minimizes unwanted x-ray signals
Cut-outs in the specimen tip are matched to the TEM configuration and provide a clear path between the sample and detector to reduce shadowing for EDS analysis
To facilitate quantitative x-ray analysis, non-rotating holder versions are equipped with a small Faraday cup located near the specimen cradle at the tip of the holder
Electrical connections are available for the non-rotating versions of the holder
Model Number | Specimen positioning | Specimen securing | Motorised control | Faraday cup | Max electrical feed-throughs |
|---|---|---|---|---|---|
643 | α tilt | Hexring® | Standard | 6 | |
646 | α, β tilt | Hexring® | β tilt | Standard | 4-6 |
650 | α tilt and rotation | Hexring® | Rotation | No | 0 |
925 | α, β tilt and rotation | Hexring® | No | 0 |
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Sales and Applications EM
Sydney • New South Wales
