Gatan F1-GIF EELS System

As materials challenges become more complex, researchers can no longer afford to compromise between range, resolution, dose, or workflow efficiency. Built for scientists pushing the boundaries of discovery, the F1-GIF™ System delivers complete chemical and structural insight in a single electron energy loss spectroscopy (EELS) platform, accelerating breakthrough research and inspiring a new era of materials science without compromise.

• Simultaneously captures range and resolution without trade-offs – Captures broad energy ranges and fine spectral detail in one acquisition, eliminating the need to choose between coverage and precision.

• Sees the full elemental picture – Resolves multiple edges with the clarity needed for confident chemical identification across complex, multi-element materials.

• Operates seamlessly across accelerating voltages – Uses one large-format direct detection platform for low- and high-kV analysis from 30 to 300 kV.

• Faster answers with less sample damage – Uses direct detection and dose fractionation to collect rapid frames, sum signal, correct drift, and preserve sensitive specimens.

• Unified, multidimensional analysis – Correlates EELS with 4D STEM for a 5D STEM workflow that connects composition, chemical state, structure, orientation, strain, and local potential.