JEOL JCM-7000Plus NeoScope Benchtop SEM

The JCM-7000Plus benchtop SEM transforms a routine observation into immediate insight. By combining high-quality SEM imaging with real-time elemental analysis and automated workflows, this benchtop SEM helps users quickly understand their specimens and move confidently to the next step.

Whether screening materials, investigating defects, or performing quality control, the JCM-7000Plus delivers the information you need—when you need it.

Observe Now - From a simple SEM observation to live analysis

• Seamless operation from optical to SEM Imaging

• Advanced four Live functions (elemental analysis, mapping, 3D, and particle)

• Observe specimens as they are in low vacuum mode

Act Next - High-quality data to support your decision

• 6 nm resolution achieved

• Highly precise observation and analysis in high vacuum mode

• Enhanced auto functions (repetitive measurement, wide area, and multiple locations)

Neo Action - Automate repetitive measurements

Neo Action (optional) is an SEM function to automatically observe/analyse specimen by changing conditions such as landing voltage/signals, automatic image adjusting, and changing positions based on predefined workflows, as if operated by an operator. This allows for unattended routine work from data acquisition to report generation (please view image above).