Date : Friday 7 November 2025
Time : 1am NZDT | 3am AEDT | Midnight AWST
See how Metro counting cameras enable low-dose electron diffraction and 4D STEM without a beam stop. This webinar shows how electron counting suppresses background noise, expanding dynamic range, and producing high-fidelity patterns, even on highly beam-sensitive materials. Patterns captured from graphene, zeolite, MOF, and COF samples will be presented. We'll also show how DigitalMicrograph streamlines acquisition, processing, and visualisation, making advanced in-situ diffraction and 4D STEM techniques easy.
If you are unable to attend the live event, please register and a recording will be sent to you.