Introduction to PeakForce AFM-IR

Date : Thursday 22 October 2026
Time : 4am NZDT | 2am AEDT | 11pm AWST (21 Oct)
(If you can’t attend, please register to receive the recording)

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PeakForce AFM-IR is a novel, powerful variant of the photothermal AFM-IR technique based on Bruker’s PeakForce Tapping mode. The method has demonstrated monolayer detection sensitivity, 10 nm spatial resolution for IR measurements, and enabled simultaneous nanoscale mechanical characterizations. By detecting the AFM-IR signals during specific time segments (or ‘Gates’) of the PeakForce Tapping oscillation cycle, AFM-IR performance can be further enhanced.

In this webinar we will report:

• Operational simplicity with robust, easy-to-control parameters

• Potential to collect gated AFM-IR measurements during both the contact and non-contact parts of the PeakForce Tapping cycle, an approach which can be used to enhance spectral performance by applying an in-situ subtraction of the background signal.

• Capability to perform simultaneous multimodal imaging collecting both chemical information and mechanical properties, such as elastic modulus and adhesion.

The webinar will conclude with a live demonstration of Bruker’s PeakForce AFM-IR mode and a Q&A.