PLEASANTON, CA (May 19, 2026) – Gatan, Inc., a business of AMETEK Inc. and a global leader in instrumentation that enhances and extends the performance of electron microscopes, today announced the launch of the PECS™ III and Ilion® III systems. These next generation, complementary solutions represent an important evolution of Gatan’s ion milling portfolio, delivering consistent, high quality sample preparation across a wide range of materials for advanced materials characterisation and industrial laboratory workflows.
Complementing the capabilities of the new PECS III, the Ilion III system is a tabletop broad beam ion milling solution optimised for high quality cross section preparation across the diverse materials commonly encountered in industrial laboratory environments. Ilion III produces clean, damage free cross sections while preserving true microstructural detail, even in complex, heterogeneous, or mechanically fragile samples.
The Ilion III delivers high throughput material removal with milling rates of up to 800 µm/h, enabling rapid access to subsurface features and reducing time to analysis. Its broad ion beam energy range of 0.1 – 10 kV supports both efficient high energy material removal and low energy final polishing, resulting in smooth, low damage surfaces suitable for high resolution analysis.
Together, PECS III and Ilion III provide a comprehensive approach to ion milling, supporting preparation of a wide variety of materials—from semiconductor devices and battery materials to advanced alloys and fragile structures—while improving reproducibility and minimising preparation induced artifacts.
For further information please contact us or read more on the new PECS III or new Ilion III.
