Addressing the Exacting Demands of 2D Materials Research
Modern 2D materials research increasingly requires atomic-scale resolution, quantitative measurements, and advanced characterisation capabilities.
Dimension 2D AFMs - built on Bruker's proven Dimension® platforms - are optimised for these unique requirements across research on graphene, TMD's, hBN, MXenes, van der Waals heterostructures, and emerging twistonic devices.
Dimension 2D enables researchers to:
Interrogate layers, defects, interfaces, and moiré-scale structures with atomic-resolution imaging and the stability required for quantitative nanometrology
Correlate structure with local functional response using an extensive toolkit of property-specific AFM modes
Navigate large sample areas with ease for flake-finding, optical overview imaging, automated imaging routines, and sample cleaning or smoothing
By combining ultra-low drift and advanced characterisation capabilities with workflow-focused automation, Dimension 2D AFMs address the exacting demands of 2D materials research.
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