New Dimension 2D Atomic Force Microscopes

Modern 2D materials research increasingly requires atomic-scale resolution, quantitative measurements, and advanced characterisation capabilities.

Dimension 2D AFMs - built on Bruker's proven Dimension® platforms - are optimised for these unique requirements across research on graphene, TMD's, hBN, MXenes, van der Waals heterostructures, and emerging twistonic devices.

Dimension 2D enables researchers to:

Interrogate layers, defects, interfaces, and moiré-scale structures with atomic-resolution imaging and the stability required for quantitative nanometrology

Correlate structure with local functional response using an extensive toolkit of property-specific AFM modes

Navigate large sample areas with ease for flake-finding, optical overview imaging, automated imaging routines, and sample cleaning or smoothing

By combining ultra-low drift and advanced characterisation capabilities with workflow-focused automation, Dimension 2D AFMs address the exacting demands of 2D materials research.

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