Atomic force microscopy-based infrared spectroscopy (AFM-IR) uses an AFM probe to locally detect sample thermal expansaion from absorption of infrared radiation. Thus it can provide the spatial resolution of AFM in combination with the chemical analysis and compositional imaging capabilities of infrared spectroscopy. Incorporating proprietary technology and building upon years of industry-leading AFM-IR instrument manufacturing, te new Anasys nanoIR2 is the highest performance nanoscale IR spectroscopy, chemical imaging, and materials property mapping system available today for materials and life science applications.
