Understanding Kelvin Probe Force Microscopy (KPFM)

Designed for AFM Users to Support your Research Needs

Thursday 16 December, 2pm AEDT

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The combination of Atomic Force Microscope (AFM) of Kelvin Probe technique brings a powerful tool to map Contact Potential Difference (CPD) on conducting and semi-conducting samples. The basic idea of KPFM is the same - An AC voltage with certain frequency as applied between AFM tip and sample; and the resulting electrostatic force is detected by a lock-in amplifier.

Join this webinar to learn what signals are acquired from the lock-in amplifier and how they are used as feedback to measure the CPD. Common questions would also be answered including :

• Which channel should be monitored during KPFM measurement?
• Can HOPG be used as a standard sample for KPFM?
• Any parameters other than lift height and AC voltage, can be adjusted to improve the measurement?