Wednesday 1 June 2022 12 midnight (2 Jun) NZST, 10pm AEST, 8pm AWST
Bruker is dedicated to providing a complete range of high-performance metrology techniques for the nanometre-scale surface characterisation of glass and ceramic products. Join us for this virtual Surface Lab session where we will present a range of characterisation techniques, their features, capabilities, and applications.
Highlights of the workshop:
The following techniques will be covered:
Atomic Force Microscopy: For high-resolution, topographical, nanomechanical, nanoelectrical, and nanoelectrochemical characterisation of materials.
Nano-Indentation: Nano-mechanical characterisation using nano-indentation methods
Optical Profilers: For 2D roughness surface characterisation and advanced 3D mapping and measurement of thin film thickness, stress, surface roughness and form
Speakers:
| Dr Peter De Wolf Worldwide Application Director | Dr Mickael Febvre Application Manager Europe |
| Dr Ude Hangen Applications Manager | Dr Vishal Panchal Application Scientist |
| Dr Udo Volz Application Scientist |
