Date: Wednesday 8 April 2026
Time: 3am NZST | 1am AEST | 11pm AWST
Characterising 2D materials involves examining a wide range of nanoscale structures, properties, and chemistry. Atomic force microscopy (AFM) is extremely versatile, making it ideal for addressing these complexities. With AFM, researchers can investigate various aspects of 2D materials (often simultaneously), gaining detailed insights that are essential for advanced applications.
Join us for this webinar to learn about:
Single-platform correlation of structure, properties, and chemistry
Commonly used AFM modes for 2D materials characterisation
Manipulation modes for in-situ device fabrication by cutting, folding, or oxidation
Speakers:
Peter De Wolf, Ph.D. Director of Technology & Application Development, Bruker Nanosurfaces
Bede Pittenger, Ph.D. Senior Development Scientist, Bruker Nanosurfaces
Ming Ye, Ph.D. Applications Scientist, AFM Applications, Bruker Nanosurfaces
PLEASE NOTE: If you are unable to attend this webinar, please register here and we will email you the recording.
