Bruker ContourX-100 3D Optical Profilometer

The ContourX family of profilometers utilises numerous Bruker-exclusive WLI technology advances to deliver the industry's most capable benchtop metrology and easiest to use surface measurement software. Available in three benchtop models, the ContourX profilers feature new, robust design and provide a range of capabilities and price points optimised to match individual metrology and budget requirements. New hardware features include an innovative stage design for larger stitching capbilities and a 5MP camera with a 1200 x 1000 measurement array for lower noise, larger field-of-view, and higher lateral resolution.

The ContourX-100 Optical Profilometer sets a new benchmark for accurate and repeatable non-contact surface metrology at a best-in-class price point.

• Industry-best Z resolution, independent of magnification

• Largest standard field of view

• Compact, vibration-tolerant design for highest stability and repeatability

• Easy-to-use intreface for quick and accurate results

• Extensive library of filters and anlaysis options for roughness, surface texture and critical dimension

The small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities in a streamlined package that incorporates decades of proprietary Bruker white light interferometry (WLI) innovation. The gage-capable benchtop system features the industry's most advanced user-friendly interface to provide intuitive access to an extensive library of pre-programmed filters and analyses for precision machined surfaces, thick films, and tribology applications. Next-generation enhancements include a new 5 MP camera, updated stage, and new measurement modes for even wider flexibility. You will not find a more streamlined benchtop system with better value than the ContourX-100.