The only fully integrated EBSD software that provides microstructure visualisation and analysis for interrogating and understanding your data
EDAX OIM Analysis™ is the premier microstructural visualisation and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data. With as little as one click, see how this powerful tool can map large, multidimensional data sets or draw from the most comprehensive analysis portfolio to characterise challenging materials. OIM Analysis not only delivers unprecedented insight into material properties but makes EBSD analysis accessible to novice and expert users alike.
Produces answers to the most common questions with one click using the Quick-Gen predefined analysis tools and templates
Allows you to clearly visualise deformed microstructures and accurately analyse complex materials
Finds key contributors or outlines in your microstructure with its interactive analysis interface
Measures difficult or previously unusable samples using the biggest analysis toolbox available
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Sales and Applications EM
Sydney • New South Wales
