EDAX Orientation Imaging Microscopy (OIM) Data Analysis

OIM Analysis™ is the premier microstructural visualisation and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data. Analysis options inlcude comprehensive grayscale and colour mapping tools to display orientations, grain boundaries, phases, energy dispersive X-ray spectrocsopy (EDS/EDX) information, and local deformation.

Most analysis results can be displayed in colorful, meaningful maps and quantified in charts and texture calculations. As all points in the data displays are linked to their measurement location in the map, interactive highlighting allows specific microstructural features to be investigated by displaying selected points in all other representations.

Significant new functionality has been introduced into the software, including:

• Multithreading optimisation to allow users to take advantage of modern computer technology
• EBSD pattern reindexing to improve indexing performance away from the scanning electron microscope (SEM) with EDAX's Triplet Indexing, ChI-Scan™, and NPAR™ technologies
• OIM Matrix™ dynamic pattern simulation for dictionary indexing and structure file optimisation
• Anti-grain analysis for characterisation of non-indexed datapoints
• Correlation plots for understanding the relationship between different EBSD measurements metrics