High-angle annular dark field (HAADF), annular dark field (ADF) plus bright and dark field (BF/DF) detectors for STEM imaging optimised for electron energy loss spectroscopy (EELS)
For EELS mapping and scanning transmission electron microscopy (STEM) imaging, proper control of detector angles is critical in both data collection efficiency and its interpretation. The Advanced STEM detectors are optimized to work with EELS systems to provide seamless collection of the entire angular range of scattered electrons for an enhanced understanding of each sample's chemical and compositional properties.
Optimised angles: Collect HAADF and strong, medium-angle images at EELS compatible STEM camera length. No need to compromise EELS collection angles due to poorly match detector geometry
Calibratd output: Automatically subtracts baseline and computes detector gain to measure the signal in units of primary electrons for quantitative imaging (requires DigiScan™ II system)
Low noise and broad range: Span single electron sensitivity through high dose images using a single detector
Compatible with Gatan cameras: Installs with retractable Gatan cameras to replace TEM supplied on-axis detectors
Send us a message and our team will get back to you.
Sales and Applications EM
Sydney • New South Wales
