Gatan Advanced STEM Detectors

For EELS mapping and scanning transmission electron microscopy (STEM) imaging, proper control of detector angles is critical in both data collection efficiency and its interpretation. The Advanced STEM detectors are optimized to work with EELS systems to provide seamless collection of the entire angular range of scattered electrons for an enhanced understanding of each sample's chemical and compositional properties.

• Maximise electron collection using detectors optimised for EELS, diffraction contrast STEM and HAADF STEM applications
  Forward scattered electrons - EELS signal (0 to ß), collection angle ß regulated by STEM camera length
  Medium-angle electrons - Advanced BF/DF STEM detector (ß to 2x ß)
  High-angle electrons - HAADF detector (~2x ß to 7x ß)

• Calibrate detector offset and system gain to allow absolute intensity measurements

• Low noise electronics and scintillator/photomultiplier tube (PMT) based design
  Detect single electrons at low fluxes
  Record high signal-to-noise ratio images at typical fluxes

• Optimise contrast in real-time using automated PMT gain selection

• Computer control of detector gain and insertion for remote operation

• One-click switching from dark field to bright field STEM mode (model 807)

• Ideal integration with GIF Continuum®, GIF Quantum® and Enfinium™ EELS systems

• Compatible with Gatan cameras and DigiScan™ II system to upgrade existing STEM imaging installations