The NanoWizard 4 XP Nanoscience atomic force microscope delivers atomic resolution and a large scan range of 100µm in one system. It enables fast scanning with rates of up to 150lines/sec and seamless integration with advanced optical techniques. A wide range of modes and accessories for environmental control, mapping of nanomechanical, electrical, magnetic or thermal properties, makes it the most flexible system available on the market today.
In-situ SEM Nanomechanical Characterisation with the New Performech III Controller
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Combining the best of AFM-IR and PeakForce Tapping
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Manufacturers of Evactron Plasma Cleaning Systems
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Dose-efficient wide-energy-range EELS with the F1-GIF system
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