More surface understanding. More speed. More accuracy.
What if your measurement system could deliver more than dimensional values?
The new µCMM NEO from Bruker Alicona moves beyond dimensions to provide real surface‑based understanding of functional features—delivering more information per measurement minute and deeper insight into the functional behavior of your components.
Built on 25 years of optical metrology expertise, the next generation of µCMM technology combines enhanced accuracy across five precision axes with significantly higher measurement speed and advanced optical 3D measurement technologies—developed for manufacturers working with the highest precision requirements.
