Introducing the New NeoScope Benchtop SEM

The new JCM-7000Plus NeoScope™ Benchtop SEM retains the simple, user-friendly GUI of the JCM-7000 while offering improved observation, analysis, and measurement performance.

Improved resolution and image quality
The landing voltage has been extended to 20kV, achieving a resolution of 6 nm for secondary electron images and 8 nm for backscattered electron images. An improved backscattered electron detector also provides higher-quality images

New Live Particle function
Live Particle automatically measures particle size and count in real time during observation, simplifying the particle analysis workflow.

Enhanced Automated Functions
The enhanced automation feature, Neo Action, supports unattended routine work from data acquisition through report generation.

These features simplify routine tasks, making them more intuitive and efficient while supporting users throughout their analytical workflows.

For further information please contact Dr Arnab Chakraborty or read more.