Friday 18 November 2022
6am NZDT, 4am AEDT, 1am AWDT
This webinar focuses on how advanced spectroscopic reflectometry and ellipsometry techniques serve process optimisation, quality control, and research for thin film-based devices, including medical sensors, MEMS, integrated circuits (IC), and semiconductor advanced packaging. An overview of these techniques will reveal how Bruker’s unique algorithms and hardware implementation alleviates common pitfalls and strengthens accuracy. This technology also expands measured thin film parameters to include porosity, composition, surface roughness, band gap energy, and film gradient. Use cases will be developed around medical devices, multi-layer film stacks for LED/front-end semiconductors, and through silicon via (TSV) for wafer-level packaging/MEMS.
Webinar Speaker:
Christopher Claypool
Sr. Director, R&D, Filmtek Products, Bruker
