Date: Thursday 28 August 2025
Time: 3am NZST | 1am AEST | 11pm AWST (Wed)
Presenter: Fernando Castro, Ph.D, Application Scientist, Gatan
STEMx OIM is the latest addition to 4D STEM analysis tools in DigitalMicrograph software, which automates 4D STEM orientation and phase mapping, with no scripting required!
This webinar will cover STEMx OIM workflows for diffraction indexing and orientation mapping, and demonstrate how to leverage eaSI technology for advanced experiments, including precession electron diffraction and multimodal 4D STEM combined with EELS or EDS.
