Date: Friday 9 May 2025
Time: 4am NZST | 2am AEST | 12 Midnight AWST
If you are not a night owl, register and the recording will be emailed to you
In this electron energy loss spectroscopy (EELS) webinar, we demonstrate the capabilities of Gatan electron counting cameras, and eaSI™ technology, which together enable SI data capture at rates of up to 9,000 pixels/s. The near-zero read noise afforded by these cameras enables these ultra-high spectral rates to be utilised effectively, meaning a multi-frame acquisition approach is typically highly advantageous for all experimental workflows. Large field of view single SI passes can be acquired in just a few seconds, which gives the benefits of reduced dose rate data capture and high-frequency drift correction. Compromised data can be discarded post-acquisition, allowing “dose tuning†to be performed after the fact – ideal when you don’t know the critical damage dose ahead of time for total-dose sensitive samples.
A broad range of application examples using this methodology are presented, including elemental mapping in frozen cell sections (STEM cryo-EELS), electron energy loss near-edge structure (ELNES) mapping of transition metal K-edges (ultra-high energy-loss EELS), as well as atomic resolution EELS mapping of beam-sensitive oxides at low temperature (HR-STEM, Cryo-EELS).
Presenter: Liam Spillane, Analytical Application Scientist, Gatan Inc
