Date: Thursday 23 May 2024
Time: 3am NZST, 1am AEST, 11pm AWST (Wed 22 May)
The development of new direct electron detection as well as low-noise, high-speed CMOS cameras has enabled an entirely new realm of analytical (scanning) transmission electron microscopy, including 4D STEM and in-situ videography. In this webinar, we will discuss the integration of a ClearView camera into the JEOL ARM200CF at the University of Illinois – Chicago for atomic-resolution, in-situ, and 4D STEM analysis over a range of acceleration voltages and imaging conditions. Specifically, we will highlight some recent results, including the in-situ transformation of Mg(Mn,Cr)2O4, phase analysis in complex oxide thin films, and electrochemistry measurements using an in-situ liquid-cell at elevated temperatures. Imaging with the ClearView camera is combined with high-resolution EELS measurements using the GIF Continuum.
Presenter:
Robert F. Klie, Ph.D., FMSA
Professor and Head of Department, Department of Physics, University of Illinois Chicago
