Bruker RTESP/A Silicon AFM Probes

Bruker AFM Probes has introduced an improved version of its popular MPP line of AFM probes. Bruker's new RTESP/A high quality, premium etched silicon probes with rotated tips complement the TESP-V2 range of probes and sets the industry standard for imaging in TappingMode_^TM , non-contact mode in air, force modulation measurements, and contact mode imaging.

The new RTESP/A design provides :

• A rotated probe tip for a more symmetrical representation of sample features

• Tighter dimensional specifications for improved probe-to-probe consistency

• Tighter alignment of the tip apex at the cantilever resulting in easier laser positioning over the tip

• Improved probe quality and aesthetics