Gatan PIPS II System

The PIPS™ (precision ion polishing system) II is a revolutionary enhancement of the PIPS ion mill that has defined the standard for transmission electron microscope (TEM) sample preparation for over 20 years. The PIPS II incorporates the WhisperLok® system with the X, Y positioning stage for precise centering of the milling target. It also includes a 10" touchscreen for ease of use and increased control and reproducibility of the milling process. The optional digital zoom microscope monitors the polishing process in real-time, plus the color images can be stored in DigitalMicrograph® software for review and analysis while the sample is in the TEM.

Features:

• X,Y stage permits alignment of argon beams to region of interest on the sample
• Improved collimated beam provides useable voltages as low as 100 volts for rapid and damage free preparation of FIB lamella
• Digital optical imaging with image storage and analysis in DigitalMicrograph® software
• 10" color touch screen for display and control of all PIPS™ II parameters