Precision ion polishing system for precise centering, control, and reproducibility of your milling process
The PIPS™ (precision ion polishing system) II is a revolutionary enhancement of the PIPS ion mill that has defined the standard for transmission electron microscope (TEM) sample preparation for over 20 years. The PIPS II incorporates the WhisperLok® system with the X, Y positioning stage for precise centering of the milling target. It also includes a 10" touchscreen for ease of use and increased control and reproducibility of the milling process. The optional digital zoom microscope monitors the polishing process in real-time, plus the color images can be stored in DigitalMicrograph® software for review and analysis while the sample is in the TEM.
Features:
X,Y stage permits alignment of argon beams to region of interest on the sample
Improved collimated beam provides useable voltages as low as 100 volts for rapid and damage free preparation of FIB lamella
Digital optical imaging with image storage and analysis in DigitalMicrograph® software
10" color touch screen for display and control of all PIPS™ II parameters
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Sales and Applications EM
Sydney • New South Wales
