Day : Tuesday 9 May
Time: 3pm NZST, 1pm AEST, 11am AWST
Presenter: Christian Gow
Bruker is the worldwide leader in 3D surface measurement and inspection, offering fast, non-contact analyses for samples ranging in size from microscopic semiconductor IC chips to entire engine blocks. Their latest optical profilometers are the culmination of ten generations of proprietary Wyko® Technology advances that provide the high sensitivity and stability necessary for precision 3D surface measurements in applications and environments that are challenging for other metrology systems.
In this webinar, we will introduce White Light Interferometry (WLI) 3D Optical Profiler system which characterising nanoscale surface texture for variety of applications from Semiconductor, Microelectronics, Precision machining to Automotive industry. We will share example of applications as well as important features of the newly launched ContourX-1000 and NPFLEX-1000 profiling system.
