When : Tuesday 29 October 2024
Time : 7pm NZDT, 5pm AEDT, 2pm AWST
We will introduce Bruker’s new 11th generation Dektak Pro Stylus Profiler, providing even more enhanced operability, reliability, and measurement accuracy to enhance and extend the qualities that make Dektak synonymous with stylus profiling.
Additionally we will explore how stylus profilers can characterise a diverse range of materials, particularly in microelectronics and semiconductor applications. Many processes in semiconductors, optical coatings, and micro-electromechanical systems (MEMS), as well as research in flexible electronics and sensors, depend on accurate thickness and etch-depth measurements. Among their various metrology capabilities, stylus profilers excel at delivering exceptional step height measurements at both the nanoscale and microscale.
