Webinar : Nanoscope 6 : Benefits of the Added Capability and Performance

With continuous developments over the past more than three decades, atomic force microscopy (AFM) has become an essential characterization technique, enabling the discoveries across a nearly countless array of disciplines and applications due to its unique capability of conveying rich physical and chemical information at nanometer scale. As the leader in the advances of AFM technology since the introduction of the first commercial system in the 1980s, Bruker is proud to release the brand-new Nanoscope 6 controller. With the full-spectrum hardware upgrades, the Nanoscope 6 controller not only boosts the AFM performance, but also provides many new capabilities and features, which could offer scientists new opportunities to obtain richer and finer information on complex samples. 20 times faster data acquisition and processing can capture fine details hidden within the force-distance curves in the popular PeakForce Tapping modes, and it also significantly improves the signal-to-noise ratio in other modes like Tapping mode and Contact Resonance-based modes. Switching Spectroscopy PFM mode offers a full suite to quantify nanoscale switching dynamics in ferroelectrics, from data collection to automatic data analysis. AFM-nDMA provides an accurate and complete solution to access the viscoelastic properties at nanoscale.