Wednesday 13 April 2022 9am PDT
The Dimension IconIR combines Bruker’s industry-leading nanoIR™ photothermal AFM-IR technology with the large-sample Dimension Icon® AFM platform to establish new standards in chemical and material property mapping with sub-10nm chemical imaging resolution and correlative microscopy.
Join us for this virtual workshop we will introduce photothermal AFM-IR spectroscopy on Bruker’s newest AFM-IR product, including discussion of applications and co-localized imaging with Photothermal AFM-IR and PeakForce property mapping modes.
Presentations by the nanoIR team will be interspersed with live demonstrations of sample measurement with the Dimension IconIR with multiple co-local datasets.
Workshop Speakers
Curtis Marcott
Senior Partner, Light Light Solutions
Dean Dawson
Senior Director - nanoIR, Bruker
Qichi Hu
Senior Staff Applications Scientist, Bruker
Cassandra Phillips
Application Scientist, Bruker
Every breakthrough begins with seeing more
Read more
Next generation SEM picoindenter controller offering enhanced speed
Read more
Addressing the Exacting Demands of 2D Materials Research
Read more