8 products
Ideal for preparing cross sectional transmission electron microscopy (XTEM) samples of semiconductor devices, thin films of various substrates, and composites
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Fast and reliable mechanical method of pre-thinning to near electron transparency to greatly reduce your ion milling times and uneven thinning
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Pre-thin and polish your samples to reduce ion milling times and improve quality
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Preferred method for cutting transmission electron microscope (TEM) discs from metals, alloys, and all ductile materials
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Accommodate multiple specimens for increased productivity
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Precision ion polishing system for precise centering, control, and reproducibility of your milling process
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The next-generation plasma tool to remove hydrocarbon contamination from TEM and SEM samples and holders
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Cut your brittle materials beyond the 3 mm transmission electron microscope (TEM) disc to accurately cut holes or unique shapes
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Sales and Applications EM
Sydney • New South Wales
Field Service
Sydney • New South Wales